Basic Implant Scanning: Application with the Straumann SIRIOS™ X3
COURSE OVERVIEW
This course provides foundational instruction in digital scanning protocols for implant-supported restorations. Participants will review key components of manufacturer-recommended (OEM) digital workflows, including appropriate selection, placement and verification of scan bodies.
This course also addresses scanner-specific features and techniques that enhance scan accuracy and efficiency; it focuses on developing practical competencies in implant scanning to support accurate data capture, improved communication with the laboratory and predictable restorative outcomes.
Audience: Dentists, Dental Assistants, Technicians
Recommended Pre-requisite: None
Format
Lecture,
Live Webinar
Subject
010 Basic Sciences
Speaker
Ron Roche
Course Date
June 4th
@ 7:00 PM ET /
4:00 PM PT
Credit
1 CEU
Course Fee
Free
LEARNING OBJECTIVES
At the end of this course, attendees should be able to:
■ Demonstrate appropriate scanning protocols for single implant crown cases, including digital charting and data acquisition
■ Demonstrate appropriate scanning protocols for single implant crown cases, including digital charting and data acquisition
■ Describe the selection, placement, verification and clinical function of scan bodies within digital implant workflows
■ Identify intraoral scanner tools that influence accuracy and efficiency in implant scanning procedures
■ Apply techniques for capturing accurate bilateral bite registrations to support proper occlusal relationships in digital workflows
with Sponsorship by Straumann
Ron Roche


